Structural Properties of Carbon Nanotube thin Film Deposit by Pulsed Laser Depositions

Abstract

This paper reports the structural properties of carbon nanotubes prepared with pulsed laser depositions. The films deposited on siliconssubstrated usedNd:YAG lasers (1064 nm) as the light source. The structured properties were characterize by X-ray diffraction, atomic force microscopy and FSEM measurements. That films grown have a polycrystalline structure at three energies 300J, 400J, 500J, from the X– ray diffraction spectra of carbon nanotube that there are three peaks at three energies and at 400 J the peak little shitted off, AFM result showed increased of roughness and root mean square with increased of energy, and FESEM showed a homogenous pattern and formation.